GD-10 series is a new electrical geophysical exploration system with highly engineered & cuttingedge technology with a revolutionary change. It is promoted to market focusingthe best solution to meet emerging technological advancements, costaffordability, flexibility in field practices, the greatest accuracy ingeo-electrical exploration, the enduring sustainability for a basic user to aprogressive researcher.

GD-10 series supports1D VES, 2D ERI and 3D ERT Resistivity/IP measurement, which are the versatilegeophysical method apply for a broad range of applications, as groundwater andmineral exploration, infrastructure site investigations and so on.

GD-10 seriesdivided into Junior, Senior, Supreme 2D, Supreme 2D Plus, Supreme 3D and Supreme 3D Plus with different configurations.

GD-10 Junior D.C. Ground Resistivity Meter is the basic model only with functionof SP survey and 1D Resistivity VES survey. 

Power: 600V/1200Vp-p, 4A, 2400W

Function;

* SP(self-potential) survey   &  1D Resistivity VES survey

Application :

* Underground water exploration

* Pollution monitoring and mapping

* Salinity control

* Depth-to-rock determination

* Weathered bedrock localization                               

* Depth and thickness of aquifers

* Civil engineering

* Archangeology

Feature:

* Modular Design: Hardware, Software and License are separate entity. It supports online upgrade for more function.

* Receiver and Transmitter designed in one hardware unit.

* Two software platforms: GD-10 UI combined Geomative Studio data management software on PC enable the easy operation and high efficiency.

* USB serial interface enables the instrument to communicate with computers for upgrade or data manage. 

* Receiver supports transient over-voltage protection for input voltage; transmitter supports protections of over-voltage, over-current, AB open-circuit, reverse connect.

* Real-time on-side measuring data evaluation.

* 8GB storage capacity for data, including measuring parameters (voltage, current, resistivity, relative error, SP, array constant, measuring point and so on), device parameters, and project parameters.